Electromigration Modeling at Circuit Layout Level (SpringerBriefs in Applied Sciences and Technology)

by Cher Ming Tan (Author), Cher Ming Tan (Author), Feifei He (Contributor)

• New

  Paperback
  2013

  $64.33

  Integrated circuit (IC) reliability is of increasing concern in present-day IC technology where the interconnect failures significantly increases the failure rate for ICs with decreasing interconnect dimension and increasing number of interconnect levels.