by Virendra Singh (Editor), S. Rajaram (Editor), D. Gracia Nirmala Rani (Editor), N.B. Balamurugan (Editor)
This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018.
The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces.
Format: Paperback
Pages: 740
Edition: 1st ed. 2019
Publisher: Springer
Published: 18 Mar 2019
ISBN 10: 9811359490
ISBN 13: 9789811359491