by Brajesh Kumar Kaushik (Editor), Brajesh Kumar Kaushik (Editor), Virendra Singh (Editor), Sudeb Dasgupta (Editor)
This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.
Format: Paperback
Pages: 840
Edition: 1st ed. 2017
Publisher: Springer
Published: 25 Feb 2018
ISBN 10: 9811074690
ISBN 13: 9789811074691