VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science)

VLSI Design and Test: 21st International Symposium, VDAT 2017, Roorkee, India, June 29 – July 2, 2017, Revised Selected Papers: 711 (Communications in Computer and Information Science)

by Brajesh Kumar Kaushik (Editor), Brajesh Kumar Kaushik (Editor), Virendra Singh (Editor), Sudeb Dasgupta (Editor)

Synopsis

This book constitutes the refereed proceedings of the 21st International Symposium on VLSI Design and Test, VDAT 2017, held in Roorkee, India, in June/July 2017. The 48 full papers presented together with 27 short papers were carefully reviewed and selected from 246 submissions.

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Quantity

10 in stock

More Information

Format: Paperback
Pages: 840
Edition: 1st ed. 2017
Publisher: Springer
Published: 25 Feb 2018

ISBN 10: 9811074690
ISBN 13: 9789811074691