by Guanqiu Qi (Contributor), Wei-Tek Tsai (Author)
Based on test algebra and fault location analysis, the proposed combinatorial testing method can support experiments with 250 components (with 2 * (250) combinations), and can detect the fault location based on the testing results.
Format: Paperback
Pages: 140
Edition: 1st ed. 2017
Publisher: Springer
Published: 03 Nov 2017
ISBN 10: 9811044805
ISBN 13: 9789811044809