Design, Analysis and Test of Logic Circuits Under Uncertainty: 115 (Lecture Notes in Electrical Engineering)

by Igor L. Markov (Contributor), John P. Hayes (Contributor), Smita Krishnaswamy (Author)

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2014
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Format: Paperback
Pages: 136
Edition: 2013
Publisher: Springer
Published: 15 Oct 2014
ISBN 10: 9400797982
ISBN 13: 9789400797987

Design, Analysis and Test of Logic Circuits Under Uncertainty: 115 (Lecture Notes in Electrical Engineering)

New

$101.82

$101.82

More Information