CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing)

by Andrei Pavlov (Author), Manoj Sachdev (Contributor), Manoj Sachdev (Contributor), Andrei Pavlov (Author)

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Paperback
2010
$148.24

$148.24

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10 in stock

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Format: Paperback
Pages: 212
Edition: Softcover reprint of hardcover 1st ed. 2008
Publisher: Springer
Published: 28 Oct 2010
ISBN 10: 904817855X
ISBN 13: 9789048178551

CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test: 40 (Frontiers in Electronic Testing)

New

$148.24

$148.24

More Information