Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)

by Sumio Ishihara (Editor), Youichi Murakami (Editor)

New
Hardcover
2016
$175.85

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.

Synopsis

The research and its outcomes presented here is devoted to the use of x-ray scattering to study correlated electron systems and magnetism. Different x-ray based methods are provided to analyze three dimensional electron systems and the structure of transition-metal oxides.

$175.85

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20+ in stock

More Information

Format: Hardcover
Pages: 248
Edition: 1st ed. 2017
Publisher: Springer
Published: 21 Dec 2016
ISBN 10: 3662532255
ISBN 13: 9783662532256

Resonant X-Ray Scattering in Correlated Systems: 269 (Springer Tracts in Modern Physics, 269)

New

$175.85

Synopsis

$175.85

More Information