Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science)

Theoretical Concepts of X-Ray Nanoscale Analysis: Theory and Applications: 183 (Springer Series in Materials Science)

by Alexander Ulyanenkov (Contributor), IlyaFeranchuk (Contributor), Andrei Benediktovitch (Author)

Synopsis

This book surveys concepts of X-ray materials analysis, including X-ray scattering and interaction between X-rays and matter, plus techniques including high-resolution X-ray diffraction, reflectivity, grazing-incidence small-angle X-ray scattering and more.

$138.90

Quantity

10 in stock

More Information

Format: Paperback
Pages: 332
Edition: Softcover reprint of the original 1st ed. 2014
Publisher: Springer
Published: 16 Sep 2016

ISBN 10: 3662520540
ISBN 13: 9783662520543