VLSI Design and Test: 17th International Symposium, VDAT 2013, Jaipur, India, July 27-30, 2013, Proceedings: 382 (Communications in Computer and Information Science)

by Mark Zwolinski (Editor), Mark Zwolinski (Editor), Manoj Singh Gaur (Editor), Vijay Laxmi (Editor), Adit Singh (Editor), D. Boolchandani (Editor), Virendra Sing (Editor)

• New

  Paperback
  2013

  $66.75

  This book constitutes the refereed proceedings of the 17th International Symposium on VLSI Design and Test, VDAT 2013, held in Jaipur, India, in July 2013. They are organized in topical sections on VLSI design, testing and verification, embedded systems, emerging technology.