by JamesHowe (Author), Brent Fultz (Author), B . Fultz (Author)
This book explains aspects of transmission electron microscopy and x-ray diffractometry that are important for characterization of materials. The 4th edition adds new techniques such as electron tomography, nanobeam diffraction and geometric phase analysis.
Format: Hardcover
Pages: 784
Edition: 4th ed. 2013
Publisher: Springer
Published: 14 Oct 2012
ISBN 10: 3642297609
ISBN 13: 9783642297601