by Masahiro Inuiguchi (Editor), JonathanLawry (Editor), Van-NamHuynh (Editor), YoshiteruNakamori (Editor)
The 2010 International Symposium on Integrated Uncertainty Management and Applications (IUM'2010), which takes place at the Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan, between 9th-11th April, is conceived as a forum for the discussion and exchange of research results.
Format: Paperback
Pages: 560
Edition: 1st Edition.
Publisher: Springer
Published: 05 Mar 2010
ISBN 10: 364211959X
ISBN 13: 9783642119590