by Masahiro Inuiguchi (Editor), JonathanLawry (Editor), YoshiteruNakamori (Editor), Van-NamHuynh (Editor)
The 2010 International Symposium on Integrated Uncertainty Management and Applications (IUM'2010), which takes place at the Japan Advanced Institute of Science and Technology (JAIST), Ishikawa, Japan, between 9th-11th April, is conceived as a forum for the discussion and exchange of research results.
Format: Paperback
Pages: 560
Edition: 1st Edition.
Publisher: Springer
Published: 05 Mar 2010
ISBN 10: 364211959X
ISBN 13: 9783642119590