Scanning Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)

by Ludwig Reimer (Author), P.W.Hawkes (Editor)

• New

  Paperback
  2010

  $284.75

  The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.