Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (Springer Series in Advanced Microelectronics)

by OtwinBreitenstein (Author), WilhelmWarta (Author), Martin Langenkamp (Author)

• New

  Hardcover
  2010

  $184.26

  Lock-in Thermography focuses on this sensitive infrared measurement system that offers a more effective analytical capability. Though mainly covering applications in electronic materials and devices, readers will also find treatment of nondestructive evaluation.