Noncontact Atomic Force Microscopy: Volume 2 (NanoScience and Technology)

Noncontact Atomic Force Microscopy: Volume 2 (NanoScience and Technology)

by SeizoMorita (Editor), Franz J . Giessibl (Editor), RolandWiesendanger (Editor)

Synopsis

This report on scanning probe microscopy covers the latest in many related topics such as force spectroscopy and mapping with atomic resolution, atomic manipulation, magnetic exchange force microscopy, atomic and molecular imaging in liquids, and much more.

$253.95

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 419
Edition: 2009
Publisher: Springer
Published: 01 Oct 2009

ISBN 10: 3642014941
ISBN 13: 9783642014949