Image Analysis and Recognition: Third International Conference, ICIAR 2006, Póvoa de Varzim, Portugal, September 18-20, 2006, Proceedings, Part II: ... Vision, Pattern Recognition, and Graphics)

by Aurélio Campilho (Editor), Mohamed Kamel (Editor)

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  Paperback
  2006

  $153.77

  The two-volume set LNCS 4141, and LNCS 4142 constitutes the refereed proceedings of the Third International Conference on Image Analysis and Recognition, ICIAR 2006. Volume II includes papers on pattern recognition for image analysis, computer vision, biometrics, shape and matching, brain imaging, remote sensing image processing, and more.

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  2004

  $133.94

  ICIAR 2004, the International Conference on Image Analysis and Recognition, was the ?rst ICIAR conference, and was held in Porto, Portugal. ICIAR will be organized annually, and will alternate between Europe and North America. ICIAR 2005 will take place in Toronto, Ontario, Canada. The idea of o?ering these conferences came as a result of discussion between researchers in Portugal and Canada to encourage collaboration and exchange, mainly between these two countries, but also with the open participation of other countries, addressing recent advances in theory, methodology and applications. The response to the call for papers for ICIAR 2004 was very positive. From 316 full papers submitted, 210 were accepted (97 oral presentations, and 113 - sters). The review process was carried out by the Program Committee members and other reviewers; all are experts in various image analysis and recognition areas. Each paper was reviewed by at least two reviewing parties. The high q- lity of the papers in these proceedings is attributed ?rst to the authors, and second to the quality of the reviews provided by the experts. We would like to thank the authors for responding to our call, and we wholeheartedly thank the reviewers for their excellent work in such a short amount of time. We are espe- ally indebted to the Program Committee for their e?orts that allowed us to set up this publication. We were very pleased to be able to include in the conference, Prof. Murat KuntfromtheSwissFederalInstituteofTechnology,andProf. Mario ' Figueiredo, oftheInstitutoSuperiorT' ecnico,inPortugal.