Noncontact Atomic Force Microscopy (NanoScience and Technology)

by E. Meyer (Author), Roland Wiesendanger (Author), S. Morita (Author)

• New

  Illustrated
  2002

  $284.14

  Since 1995, the noncontact atomic force microscope (NC-AFM) has achieved remarkable progress. Based on nanomechanical methods, the NC-AFM detects the weak attractive force between the tip of a cantilever and a sample surface. it can measure atomic force interactions, i.e. it can be used in so-called atomic force spectroscopy (AFS);