Applied Scanning Probe Methods III: Characterization: v. 3 (NanoScience and Technology)

Applied Scanning Probe Methods III: Characterization: v. 3 (NanoScience and Technology)

by HaraldFuchs (Editor), Bharat Bhushan (Editor)

Synopsis

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

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More Information

Format: Hardcover
Pages: 378
Edition: illustrated edition
Publisher: Springer
Published: 22 Feb 2006

ISBN 10: 3540269096
ISBN 13: 9783540269090