Applied Scanning Probe Methods III: Characterization: v. 3 (NanoScience and Technology)

by HaraldFuchs (Editor), Bharat Bhushan (Editor)

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Hardcover
2006
$232.34

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

Synopsis

There are signi?cant differences between the Scanning Probe Microscopes or SPM, and others such as the Scanning Electron Microscope or SEM.

$232.34

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20+ in stock

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Format: Hardcover
Pages: 378
Edition: illustrated edition
Publisher: Springer
Published: 22 Feb 2006
ISBN 10: 3540269096
ISBN 13: 9783540269090

Applied Scanning Probe Methods III: Characterization: v. 3 (NanoScience and Technology)

New

$232.34

Synopsis

$232.34

More Information