CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)

CCD Image Sensors in Deep-Ultraviolet: Degradation Behavior and Damage Mechanisms (Microtechnology and MEMS)

by Flora Li (Author), Arokia Nathan (Author)

Synopsis

As the deep-ultraviolet (DUV) laser technology continues to mature, an increasing number of industrial and manufacturing applications are emerging. This book describes the degradation mechanisms and long-term performance of CCDs in the DUV, along with new results of device performance at these wavelengths.

$223.57

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 242
Publisher: Springer
Published: 01 Mar 2005

ISBN 10: 354022680X
ISBN 13: 9783540226802