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Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (NanoScience and Technology)

Nanoscale Characterisation of Ferroelectric Materials: Scanning Probe Microscopy Approach (NanoScience and Technology)

by Marin Alexe (Editor), Alexei Gruverman (Editor)

  • New

    Hardcover 2004

    $256.41
Synopsis

This book presents recent advances in the field of nanoscale characterization of ferroelectric materials using scanning probe microscopy (SPM).

$256.41

Quantity

20+ in stock

More Information

Format: Hardcover
 Pages: 282
 Publisher: Springer
Published: 06 Apr 2004
ISBN 10: 3540206620
ISBN 13: 9783540206620