Thin Film Analysis by X-Ray Scattering: Techniques for Structural Characterization

by Mario Birkholz (Author)

• New

  Hardcover
  2005

  $152.46

  With contributions by Paul F. Fewster and Christoph Genzel While X-ray diffraction investigation of powders and polycrystalline matter was at the forefront of materials science in the 1960s and 70s, high-tech applications at the beginning of the 21st century are driven by the materials science of thin films.