Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings (Lecture Notes in Computer Science)

by Battista Biggio (Editor), Xiao Bai (Editor), Antonio Robles-Kelly (Editor), Edwin R. Hancock (Editor), Richard C. Wilson (Editor), Tin Kam Ho (Editor)

• New

  Paperback
  2018

  $75.92

  This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018.
  The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.