Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

by Gracieli Posser (Author), Ricardo Reis (Contributor), Sachin S. Sapatnekar (Contributor)

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Format: Paperback
Pages: 140
Edition: Softcover reprint of the original 1st ed. 2017
Publisher: Springer
Published: 05 Jul 2018

ISBN 10: 331984041X
ISBN 13: 9783319840413