by Marco Loog (Editor), Francisco Escolano (Editor), Marco Loog (Editor), Battista Biggio (Editor), Francisco Escolano (Editor), Richard Wilson (Editor), Antonio Robles-Kelly (Editor)
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR.
Format: Paperback
Pages: 604
Edition: 1st ed. 2016
Publisher: Springer
Published: 05 Nov 2016
ISBN 10: 3319490540
ISBN 13: 9783319490540