Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

by RicardoReis (Author), Gracieli Posser (Author), SachinS.Sapatnekar (Author)

New
Hardcover
2016
$61.07

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

Synopsis

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power.

$61.07

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 140
Edition: 1st ed. 2017
Publisher: Springer
Published: 17 Dec 2016
ISBN 10: 3319488988
ISBN 13: 9783319488981

Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS

New

$61.07

Synopsis

$61.07

More Information