Quantum Metrology, Imaging, and Communication (Quantum Science and Technology)

Quantum Metrology, Imaging, and Communication (Quantum Science and Technology)

by David Simon (Author), Gregg Jaeger (Author), David S . Simon (Author), Alexander V . Sergienko (Author)

Synopsis

This book describes the experimental and theoretical bases for the development of specifically quantum-mechanical approaches to metrology, imaging, and communication. The particular techniques explored include two-photon interferometry, two-photon optical aberration and dispersion cancellation, lithography, microscopy, and cryptography.

$173.32

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 288
Edition: 1st ed. 2017
Publisher: Springer
Published: 26 Nov 2016

ISBN 10: 331946549X
ISBN 13: 9783319465494