Trace-Based Post-Silicon Validation for VLSI Circuits: 252 (Lecture Notes in Electrical Engineering)

Trace-Based Post-Silicon Validation for VLSI Circuits: 252 (Lecture Notes in Electrical Engineering)

by Xiao Liu (Author), Qiang Xu (Contributor)

Synopsis

This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.

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More Information

Format: Paperback
Pages: 124
Edition: Softcover reprint of the original 1st ed. 2014
Publisher: Springer
Published: 23 Aug 2016

ISBN 10: 3319375946
ISBN 13: 9783319375946