Trace-Based Post-Silicon Validation for VLSI Circuits: 252 (Lecture Notes in Electrical Engineering)

Trace-Based Post-Silicon Validation for VLSI Circuits: 252 (Lecture Notes in Electrical Engineering)

by Xiao Liu (Author), Qiang Xu (Author)

Synopsis

This book surveys state-of-the-art validation solutions based on real-time signal tracing to guarantee the correctness of VLSI circuits, discusses key challenges in post-silicon validation and offers automated solutions that are systematic and cost-effective.

$175.73

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 126
Edition: 2013
Publisher: Springer
Published: 27 Jun 2013

ISBN 10: 3319005324
ISBN 13: 9783319005324