Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

Mitigating Process Variability and Soft Errors at Circuit-Level for FinFETs

by Ricardo Reis (Author), Alexandra Zimpeck (Author), Cristina Meinhardt (Author), Laurent Artola (Author)

$123.82

Quantity

20 in stock

More Information

Format: Hardcover
Pages: 144
Edition: 1st ed. 2021
Publisher: Springer
Published: 11 Mar 2021

ISBN 10: 3030683672
ISBN 13: 9783030683672