Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science)

by Cor Claeys (Author), Cor Claeys (Author), Eddy Simoen (Contributor)

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Paperback
2019
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$157.62

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Format: Paperback
Pages: 472
Edition: Softcover reprint of the original 1st ed. 2018
Publisher: Springer
Published: 30 Jan 2019
ISBN 10: 3030067475
ISBN 13: 9783030067472

Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact: 270 (Springer Series in Materials Science)

New

$157.62

$157.62

More Information