X-ray Scattering from Semiconductors

X-ray Scattering from Semiconductors

by PaulF.Fewster (Author)

Synopsis

A practical guide to the analysis of materials, including a description of the underlying theories and instrumental aberrations caused by real experiments. The main emphasis concerns the analysis of thin films and multilayers, primarily semiconductors, although the techniques are very general.

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More Information

Format: Hardcover
Pages: 316
Edition: 2nd Revised edition
Publisher: Imperial College Press
Published: 25 Aug 2003

ISBN 10: 1860943608
ISBN 13: 9781860943607