by KenJStout (Author), Liam Blunt (Author)
Explains the basic measurement techniques, describes the commercially instruments, this fully illustrated text provides an overview of the perception of 3-D topography analysis in the academic world and industry, and the commonly used 3-D parameters and plots for the characterizing and visualizing 3-D surface topography.
Format: Hardcover
Pages: 320
Edition: 2nd Revised edition
Publisher: A Butterworth-Heinemann Title
Published: 01 Jun 2000
ISBN 10: 1857180267
ISBN 13: 9781857180268