by EdmundG.Seebauer (Author), Meredith C . Kratzer (Author)
"Charged Defects in Semiconductors" details the current state of knowledge regarding the properties of the ionized defects that can affect the behaviour of advanced transistors, photo-active devices, catalysts, and sensors.
Format: Hardcover
Pages: 294
Edition: 2nd Printing.
Publisher: Springer
Published: 01 Dec 2008
ISBN 10: 1848820585
ISBN 13: 9781848820586