Nanometer–scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)

by Abdelkhalak El Hami (Author), Philippe Pougnet (Author), Pierre-Richard Dahoo (Author)

• New

  Hardcover
  2016

  $165.04

  This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.