Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

Precision Landmark Location for Machine Vision and Photogrammetry: Finding and Achieving the Maximum Possible Accuracy

by JoséA.Gutierrez (Author), Brian S . R . Armstrong (Author)

Synopsis

This book addresses the problem of measurement error associated with determining the location of landmarks in images.

$144.60

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 162
Edition: 1st Edition.
Publisher: Springer
Published: 23 Oct 2007

ISBN 10: 1846289122
ISBN 13: 9781846289125