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Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

Applications and Metrology at Nanometer-Scale 1: Smart Materials, Electromagnetic Waves and Uncertainties

by Abdelkhalak El Hami (Author), Philippe Pougnet (Author), Pierre Richard Dahoo (Author)

$165.96

Quantity

20+ in stock

More Information

Format: Hardcover
 Edition: 1
 Publisher: Wiley-ISTE
Published: 17 May 2021
ISBN 10: 1786306409
ISBN 13: 9781786306401