by Julian J. Faraway (Author), Xiaofeng Wang (Author), Yu Ryan Yue (Author)
This book addresses the applications of extensively used regression models under a Bayesian framework. It emphasizes efficient Bayesian inference through integrated nested Laplace approximations (INLA) and real data analysis using R. The INLA method directly computes very accurate approximations to the posterior marginal distributions and is a promising alternative to Markov chain Monte Carlo (MCMC) algorithms, which come with a range of issues that impede practical use of Bayesian models.
Format: Hardcover
Pages: 312
Edition: 1
Publisher: Chapman and Hall/CRC
Published: 08 Feb 2018
ISBN 10: 1498727255
ISBN 13: 9781498727259
The book focuses on regression models with R-INLA and it will be of interest to a wide audience. INLA is becoming a very popular method for approximate Bayesian inference and it is being applied to many problems in many different fields. This book will be of interest not only to statisticians but also to applied researchers in other disciplines interested in Bayesian inference. This book can probably be used as a reference book for research and as a textbook at graduate level.
~Virgilio Gomez-Rubio, University of Castilla-La Mancha
This is a well-written book on an important subject, for which there is a lack of good introductory material. The tutorial-style works nicely, and they have an excellent set of examples. They manage to do a practical introduction with just the right amount of theory background...The book should be very useful to scientists who want to analyze data using regression models. INLA allows users to fit Bayesian models quickly and without too much programming effort, and it has been used successfully in many applications. The book is written in a tutorial style, while explaining the basics of the needed theory very well, so it could serve both as a reference or textbook...The book is well written and technically correct.
~Egil Ferkingstad, deCode genetics
The authors have done a great job of not over-doing the technical details, thereby making the presentation accessible to a broader audience beyond the statistics world...It covers many contemporary parametric, nonparametric, and semiparametric methods that applied scientists from many fields use in modern research.
~Adam Branscum, Oregon State University