Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by Alberto Bosio (Author), Luigi Dilillo (Contributor), Arnaud Virazel (Contributor), Alberto Bosio (Author), Arnaud Virazel (Contributor), Luigi Dilillo (Contributor), Patrick Girard (Contributor), Serge Pravossoudovitch (Contributor)

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Format: Paperback
Pages: 188
Edition: 2010
Publisher: Springer
Published: 03 Sep 2014

ISBN 10: 1489983147
ISBN 13: 9781489983145