Reliability of Microtechnology: Interconnects, Devices and Systems

Reliability of Microtechnology: Interconnects, Devices and Systems

by Cristina Andersson (Contributor), Cristina Andersson (Contributor), James E. Morris (Contributor), Johan Liu (Author), Jussi Sarkka (Contributor), Olli Salmela (Contributor), Per-Erik Tegehall (Contributor)

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Format: Paperback
Pages: 220
Edition: 2011
Publisher: Springer
Published: 11 Oct 2014

ISBN 10: 1489982116
ISBN 13: 9781489982117