by Georges Gielen (Author), Georges Gielen (Author), Elie Maricau (Author)
This book covers modeling, simulation and analysis of analog circuit aging, nanometer CMOS physical effects resulting in unreliability, transistor aging compact models for circuit simulation, methods for efficient circuit reliability simulation and more.
Format: Hardcover
Pages: 216
Edition: 2013
Publisher: Springer
Published: 09 Jan 2013
ISBN 10: 1461461626
ISBN 13: 9781461461623