by Osamu Ueda (Editor), Stephen J. Pearton (Editor)
This book covers reliability procedures for lasers and high speed electronics used in cell phones, satellites, data transmission systems and displays. Addresses reliability engineering, materials, reliability testing and electronic characterization.
Format: Hardcover
Pages: 634
Edition: 2013
Publisher: Springer
Published: 24 Sep 2012
ISBN 10: 1461443369
ISBN 13: 9781461443360