Thoughtful Machine Learning: A Test-Driven Approach

Thoughtful Machine Learning: A Test-Driven Approach

by Matthew Kirk (Author)

Synopsis

In this practical guide, author Matthew Kirk takes you through the principles of TDD and machine learning, and shows you how to apply TDD to several machine-learning algorithms, including Naive Bayesian classifiers and Neural Networks.

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More Information

Format: Paperback
Pages: 236
Edition: 1
Publisher: O'Reilly Media
Published: 12 Oct 2014

ISBN 10: 1449374069
ISBN 13: 9781449374068