High Quality Test Pattern Generation and Boolean Satisfiability

High Quality Test Pattern Generation and Boolean Satisfiability

by RolfDrechsler (Author), StephanEggersglüß (Author)

Synopsis

This book provides an overview of automatic test pattern generation (ATPG) and introduces novel techniques to complement classical ATPG, based on Boolean Satisfiability (SAT). It presents a fast and highly fault efficient SAT-based ATPG framework.

$146.08

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 193
Edition: 2012
Publisher: Springer
Published: 10 Mar 2011

ISBN 10: 1441999752
ISBN 13: 9781441999757