by Manjul Bhushan (Author), Mark B . Ketchen (Author)
Test structures are becoming more important in the development of CMOS technologies. Covering the basic concepts in test structure design for dedicated test vehicles, the book also examines high-speed characterization techniques for digital CMOS applications.
Format: Hardcover
Pages: 374
Edition: 1st Edition.
Publisher: Springer
Published: 28 Aug 2011
ISBN 10: 1441993762
ISBN 13: 9781441993762