by Mohammad Tehranipoor (Author), KrishnenduChakrabarty (Author), KePeng (Author)
This book introduces new techniques for detecting and diagnosing small-delay defects in integrated circuits. It details effective and scalable methodologies for screening and diagnosing small-delay defects.
Format: Hardcover
Pages: 212
Edition: 1st Edition.
Publisher: Springer
Published: 10 Sep 2011
ISBN 10: 1441982965
ISBN 13: 9781441982964