Atomic Scale Characterization and First-Principles Studies of SiN Interfaces (Springer Theses)

New
Hardcover
2011
$153.66

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

Synopsis

This book offers results that influence many high temperature and pressure applications. It provides findings that will offer increased control over the performance of ceramic and semiconductor materials for a wide-range of applications.

$153.66

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 121
Edition: 1st Edition.
Publisher: Springer
Published: 08 Apr 2011
ISBN 10: 144197816X
ISBN 13: 9781441978165

Atomic Scale Characterization and First-Principles Studies of SiN Interfaces (Springer Theses)

New

$153.66

Synopsis

$153.66

More Information