by Michael Nicolaidis (Editor)
Provides a comprehensive presentation of the research results and technological developments enabling understanding, qualifying and mitigating the soft errors effect in advanced electronics, including the fundamental physical mechanisms of radiation induced soft errors, the various steps that lead to a system failure, and more.
Format: Hardcover
Pages: 368
Edition: 1st Edition.
Publisher: Springer
Published: 29 Sep 2010
ISBN 10: 1441969926
ISBN 13: 9781441969927