Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)

Extreme Statistics in Nanoscale Memory Design (Integrated Circuits and Systems)

by Amith Singhee (Editor), RobA.Rutenbar (Editor)

Synopsis

This comprehensive book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations. It further provides solutions recently proposed in the Electronic Design Automation (EDA) community.

$172.35

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 258
Edition: 1st Edition.
Publisher: Springer
Published: 17 Sep 2010

ISBN 10: 1441966056
ISBN 13: 9781441966056