Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

Scanning Probe Microscopy of Functional Materials: Nanoscale Imaging and Spectroscopy

by Alexei Gruverman (Editor), SergeiV.Kalinin (Editor)

Synopsis

Here is a much-needed general overview of a rapidly developing field. It covers novel scanning probe microscopy (SPM) techniques that are used to characterize a wide range of functional materials, including complex oxides, biopolymers, and semiconductors.

$289.61

Quantity

20+ in stock

More Information

Format: Hardcover
Pages: 618
Edition: 1st Edition.
Publisher: Springer
Published: 10 Dec 2010

ISBN 10: 144196567X
ISBN 13: 9781441965677