by Alexandre Schmid (Author), YusufLeblebici (Author), Milo Stanisavljevi (Author)
This book is intended to give a general overview of reliability, faults, fault models, nanotechnology, nanodevices, fault-tolerant architectures and reliability evaluation techniques.
Format: Hardcover
Pages: 195
Edition: 1st Edition.
Publisher: Springer
Published: 22 Oct 2010
ISBN 10: 1441962166
ISBN 13: 9781441962164