Thermal Testing of Integrated Circuits

Thermal Testing of Integrated Circuits

by Antonio Rubio (Contributor), Antonio Rubio (Contributor), Josep Altet (Author)

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Format: Paperback
Pages: 224
Edition: Softcover reprint of the original 1st ed. 2002
Publisher: Springer
Published: 21 Sep 2011

ISBN 10: 144195287X
ISBN 13: 9781441952875